Optics Characterization Tests

UUID: F66D66DC-23E9-42EC-A635-1D8BE9832C16

Optics characterization should produce test artifacts for:

• Wavelength accuracy after pixel-to-wavelength calibration.

• FWHM of narrow emission lines.

• SNR at representative visible and near-infrared wavelengths.

• Linearity versus input intensity and integration time.

• Repeatability after repeated captures and after minor handling.

• Stray light and second-order diffraction behavior.

• Comparison with a reference source or commercial spectrometer.

The test record should include optical configuration, slit width, grating setting, filter state, integration time, calibration version, and raw exported data path.