Optics System Overview ====================== .. note:: Insert the user-provided Optics architecture diagram here after the Visio source and image are available. .. _uuid-48fc9581-eaff-4e34-9b0c-0d1bf006e71f: System Role ----------- UUID: :ref:`48FC9581-EAFF-4E34-9B0C-0D1BF006E71F ` **Summary:** The Optics system shall accept input light and coordinate collimation, wavelength dispersion, focusing, filtering, alignment, enclosure, and performance characterization to image a VIS-NIR spectrum onto the TCD1304DG effective detector array. **Expected Outcome:** The Optics system shall provide usable wavelength coverage from 400 nm to 1000 nm and approximately 5 nm FWHM for narrow sources. **Rationale:** Coordinating the optical path, filtering, and mechanical alignment preserves the wavelength-dependent image needed for detector capture and allows measured optical performance to be attributed to a repeatable configuration. .. _uuid-3a113e98-e52c-4b54-8624-4939610e4ed2: System Objectives ----------------- UUID: :ref:`3A113E98-E52C-4B54-8624-4939610E4ED2 ` **Objective 1:** **Optical transformation.** The Optics system shall accept incident light, collimate it, disperse it by wavelength, and focus the spectrum across the detector. **Rationale:** Preserving this sequence establishes the detector-position relationship required for wavelength measurement. **Objective 2:** **Component and filtering decisions.** The Optics system shall record how the grating, slit, mirrors, and filters affect wavelength coverage, resolution, throughput, second-order overlap, stray light, and alignment. **Rationale:** Recording each tradeoff prevents a component choice from changing instrument performance without reviewable evidence. **Objective 3:** **Physical verification.** The Optics system shall provide alignment, enclosure, and characterization evidence for wavelength coverage, FWHM, wavelength accuracy, SNR, linearity, repeatability, stray light, and reference comparison. **Rationale:** Physical evidence is needed to distinguish predicted optical performance from measured instrument performance. .. _uuid-e19ea297-0d3d-4bb1-b420-629bde897454: System Relationship ------------------- UUID: :ref:`E19EA297-0D3D-4BB1-B420-629BDE897454 ` .. list-table:: :header-rows: 1 * - System - Primary Responsibility - Downstream Or Adjacent Relationship * - Optical Path - The Optics optical-path system shall define the slit, collimation, dispersion, focusing, and detector-imaging sequence. - The Optics optical-path system shall establish wavelength-dependent illumination on the TCD1304DG effective array. * - Tradeoffs - The Optics tradeoff system shall record component and geometry choices with their optical consequences. - The Optics tradeoff system shall relate each choice to alignment, throughput, coverage, and resolution. * - Filtering - The Optics filtering system shall limit second-order overlap and other unwanted wavelength content before detector capture. - The Optics filtering system shall control the optical content presented to the detector and downstream Host PC processing. * - Alignment And Enclosure - The Optics alignment-and-enclosure system shall establish repeatable placement, light exclusion, and mechanical stability. - The Optics alignment-and-enclosure system shall preserve the optical configuration used for characterization and measurement. * - Performance Characterization - The Optics performance-characterization system shall define coverage, FWHM, accuracy, SNR, linearity, repeatability, stray-light, and comparison checks. - The Optics performance-characterization system shall provide optical evidence to Test and Verification and Host PC calibration workflows. .. _uuid-14a977b2-a1cd-404e-9500-1eacbf249040: Integration Boundary -------------------- UUID: :ref:`14A977B2-A1CD-404E-9500-1EACBF249040 ` **Summary:** The Optics system shall provide wavelength-dependent illumination at the detector boundary. The Embedded system shall control detector timing and digitization after that optical handoff. The Host PC system shall perform pixel-to-wavelength association, correction, visualization, retention, and export. The Test and Verification system shall provide canonical pass/fail disposition. Component placement tolerances, final slit width, grating angle, focus tolerance, filter cutoff profile, enclosure limits, and most quantitative characterization acceptance thresholds remain ``Not In Docs`` until approved requirements and methods are available. **Expected Outcome:** The Optics system shall remain independently reviewable without duplicating Embedded acquisition, Host PC processing, or Integration transport behavior. **Rationale:** Separating optical formation, detector acquisition, host-side processing, and pass/fail disposition prevents multiple subsystems from defining or evaluating the same boundary behavior differently. Related Pages ------------- * :doc:`Optical Path ` * :doc:`Tradeoffs ` * :doc:`Filtering ` * :doc:`Alignment And Enclosure ` * :doc:`Performance Characterization `